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10.1080/23746149.2018.1480420
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Recent breakthroughs in scanning transmission electron microscopy of small species
Karel Hendrik Wouter van den Bos
Thomas Altantzis
Annick De Backer
Sandra Van Aert
Sara Bals
Taylor & Francis
Advances in Physics: X, 2018. doi:10.1080/23746149.2018.1480420
STEM imaging
atom-counting
statistical parameter estimation theory
nanomaterials
beam-sensitive
3D atomic structure
Journal
Advances in Physics: X
© 2018 The Author(s). Published by Informa UK Limited, trading as Taylor & Francis Group.
2374-6149
3
1
814
832
10.1080/23746149.2018.1480420
https://doi.org/10.1080/23746149.2018.1480420
VoR
2018-08-09T13:37:29+05:30
Arbortext Advanced Print Publisher 11.0.3433/W Unicode
2018-08-24T06:49:45-07:00
2018-08-24T06:49:45-07:00
STEM imaging; atom-counting; statistical parameter estimation theory; nanomaterials; beam-sensitive; 3D atomic structure
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