| Title |
|
|
|
Three-dimensional fabrication and characterisation of core-shell nano-columns using electron beam patterning of Ge-doped
|
|
| Author |
|
|
|
|
|
| Abstract |
|
|
|
| A focused electron beam in a scanning transmission electron microscope (STEM) is used to create arrays of core-shell structures in a specimen of amorphous SiO2 doped with Ge. The same electron microscope is then used to measure the changes that occurred in the specimen in three dimensions using electron tomography. The results show that transformations in insulators that have been subjected to intense irradiation using charged particles can be studied directly in three dimensions. The fabricated structures include core-shell nano-columns, sputtered regions, voids, and clusters. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4731765] | |
|
| Language |
|
|
|
English
|
|
| Source (journal) |
|
|
|
Applied physics letters / American Institute of Physics. - New York, N.Y., 1962, currens |
|
| Publication |
|
|
|
New York, N.Y. : American Institute of Physics, 2012
|
|
| ISSN |
|
|
|
0003-6951 [print]
1077-3118 [online]
|
|
| Volume/pages |
|
|
|
100:26(2012), 4 p.
|
|
| Article Reference |
|
|
|
263113
|
|
| ISI |
|
|
|
000305831500081
|
|
| Medium |
|
|
|
E-only publicatie
|
|
| Full text (Publisher's DOI) |
|
|
| |
|
| Full text (publisher's version - intranet only) |
|
|
| |
|