| Title |
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Advanced electron microscopy for advanced materials
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| Author |
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| Abstract |
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| The idea of this Review is to introduce newly developed possibilities of advanced electron microscopy to the materials science community. Over the last decade, electron microscopy has evolved into a full analytical tool, able to provide atomic scale information on the position, nature, and even the valency atoms. This information is classically obtained in two dimensions (2D), but can now also be obtained in 3D. We show examples of applications in the field of nanoparticles and interfaces. | |
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| Language |
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English
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| Source (journal) |
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Advanced materials. - Weinheim |
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| Publication |
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Weinheim : 2012
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| ISSN |
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0935-9648
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| Volume/pages |
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24:42(2012), p. 5655-5675
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| ISI |
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000310602200001
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| Full text (publisher's version - intranet only) |
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