Publication
Title
Advanced electron microscopy for advanced materials
Author
Abstract
The idea of this Review is to introduce newly developed possibilities of advanced electron microscopy to the materials science community. Over the last decade, electron microscopy has evolved into a full analytical tool, able to provide atomic scale information on the position, nature, and even the valency atoms. This information is classically obtained in two dimensions (2D), but can now also be obtained in 3D. We show examples of applications in the field of nanoparticles and interfaces.
Language
English
Source (journal)
Advanced materials. - Weinheim
Publication
Weinheim : 2012
ISSN
0935-9648
Volume/pages
24:42(2012), p. 5655-5675
ISI
000310602200001
Full text (Publishers DOI)
Full text (publishers version - intranet only)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 29.08.2012
Last edited 30.03.2017
To cite this reference