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A new approach for measuring the value of patents based on structural indicators for ego patent citation networks
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| Author |
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| Abstract |
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| Language |
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English
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| Source (journal) |
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Journal of the American Society for Information Science and Technology. - Washington, D.C., 2001 - 2013 |
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| Publication |
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Washington, D.C. : 2012
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| ISSN |
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1532-2882 [print]
1532-2890 [online]
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| Volume/pages |
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63:9(2012), p. 1834-1842
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| ISI |
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000307730000010
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| Full text (Publisher's DOI) |
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| Full text (publisher's version - intranet only) |
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