Publication
Title
A new approach for measuring the value of patents based on structural indicators for ego patent citation networks
Author
Abstract
Technology sectors differ in terms of technological complexity. When studying technology and innovation through patent analysis it is well known that similar amounts of technological knowledge can produce different numbers of patented innovation as output. A new multilayered approach to measure the technological value of patents based on ego patent citation networks (PCNs) is developed in this study. The results show that the structural indicators for the ego PCN developed in this contribution can characterize groups of patents and, hence, in an indirect way, the health of companies.
Language
English
Source (journal)
Journal of the American Society for Information Science and Technology. - Washington, D.C., 2001 - 2013
Publication
Washington, D.C. : 2012
ISSN
1532-2882 [print]
1532-2890 [online]
Volume/pages
63:9(2012), p. 1834-1842
ISI
000307730000010
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 09.10.2012
Last edited 16.12.2017
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