| Title |
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The impact of surface and retardation losses on valence electron energy-loss spectroscopy
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| Author |
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| Abstract |
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| Language |
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English
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| Source (journal) |
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Ultramicroscopy. - Amsterdam | |
| Publication |
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Amsterdam : 2008
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| ISSN |
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0304-3991
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| Volume/pages |
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108:2(2008), p. 84-99
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| ISI |
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000252816900003
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| Full text (Publisher's DOI) |
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