| Title |
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Statistical method for thickness measurement of amorphous objects
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| Author |
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| Abstract |
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| Language |
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English
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| Source (journal) |
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Applied physics letters / American Institute of Physics. - New York, N.Y., 1962, currens |
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| Publication |
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New York, N.Y. : American Institute of Physics, 2007
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| ISSN |
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0003-6951 [print]
1077-3118 [online]
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| Volume/pages |
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90:24(2007), p. 1-3
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| Article Reference |
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241911
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| ISI |
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000247305400033
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E-only publicatie
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| Full text (Publisher's DOI) |
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