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Statistical method for thickness measurement of amorphous objects
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| Author |
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| Abstract |
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| The authors propose a nondestructive method for the determination of the thickness of an amorphous sample. This method is based on the statistics of the phase of the electron exit wave function, which depend on the number of atoms traversed by the incident electron which itself is a function of the thickness of the object. The accuracy of this method has been checked numerically by the multislice method and compared with that based on the mean inner potential. (c) 2007 American Institute of Physics. |
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English
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| Source (journal) |
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Applied physics letters / American Institute of Physics. - New York, N.Y., 1962, currens |
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| Publication |
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New York, N.Y. : American Institute of Physics, 2007
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| ISSN |
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0003-6951 [print]
1077-3118 [online]
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| Volume/pages |
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90:24(2007), p. 1-3
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| Article Reference |
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241911
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| ISI |
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000247305400033
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E-only publicatie
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| Full text (Publisher's DOI) |
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| Full text (open access) |
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