Title |
|
|
|
Statistical method for thickness measurement of amorphous objects
|
|
Author |
|
|
|
|
|
Abstract |
|
|
| |
|
Language |
|
|
|
English
|
|
Source (journal) |
|
|
|
Applied physics letters / American Institute of Physics. - New York, N.Y., 1962, currens |
|
Publication |
|
|
|
New York, N.Y. : American Institute of Physics, 2007
|
|
ISSN |
|
|
|
0003-6951 [print]
1077-3118 [online]
|
|
Volume/pages |
|
|
|
90:24(2007), p. 1-3
|
|
Article Reference |
|
|
|
241911
|
|
ISI |
|
|
|
000247305400033
|
|
Medium |
|
|
|
E-only publicatie
|
|
Full text (Publisher's DOI) |
|
|
| |
|
Full text (open access) |
|
|
| |
|