Publication
Title
Barrier permeation effects on the inversion layer subband structure and its applications to the electron mobility
Author
Abstract
Language
English
Source (journal)
Microelectronic engineering. - Amsterdam
Publication
Amsterdam : 2005
ISSN
0167-9317
Volume/pages
80(2005), p. 82-85
ISI
000231517000021
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 03.01.2013
Last edited 14.09.2018
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