Publication
Title
In situ transmission electron microscopy study of Ni silicide phases formed on (001) Si active lines
Author
Abstract
Language
English
Source (journal)
Journal of applied physics / American Institute of Physics. - New York, N.Y., 1937, currens
Publication
New York, N.Y. : American Institute of Physics, 2001
ISSN
0021-8979 [print]
1089-7550 [online]
Volume/pages
90:1(2001), p. 167-174
ISI
000169361100023
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 03.01.2013
Last edited 13.08.2018
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