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In situ transmission electron microscopy study of Ni silicide phases formed on (001) Si active lines
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| Author |
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| Abstract |
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| The formation of Ni silicides is studied by transmission electron microscopy during in situ heating experiments of 12 nm Ni layers on blanket silicon, or in patterned structures covered with a thin chemical oxide. It is shown that the first phase formed is the NiSi2 which grows epitaxially in pyramidal crystals. The formation of NiSi occurs quite abruptly around 400 degreesC when a monosilicide layer covers the disilicide grains and the silicon in between. The NiSi phase remains stable up to 800 degreesC, at which temperature the layer finally fully transforms to NiSi2. The monosilicide grains show different epitaxial relationships with the Si substrate. Ni2Si is never observed. (C) 2001 American Institute of Physics. | | |
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English
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Journal of applied physics / American Institute of Physics. - New York, N.Y., 1937, currens | |
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New York, N.Y. : American Institute of Physics, 2001
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0021-8979 [print]
1089-7550 [online]
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90:1(2001), p. 167-174
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000169361100023
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