Title
<tex>$YBa_{2}Cu_{3}O_{7-x}$</tex> Josephson junctions and dc SQUIDs based on <tex>$45^{\text{\textdegree}}$</tex> a-axis tilt and twist grain boundaries : atomically clean interfaces for applications <tex>$YBa_{2}Cu_{3}O_{7-x}$</tex> Josephson junctions and dc SQUIDs based on <tex>$45^{\text{\textdegree}}$</tex> a-axis tilt and twist grain boundaries : atomically clean interfaces for applications
Author
Faculty/Department
Faculty of Sciences. Physics
Publication type
article
Publication
Bristol ,
Subject
Physics
Source (journal)
Superconductor science and technology. - Bristol
Source (book)
International Superconductive Electronics Conference, JUN 21-25, 1999, BERKELEY, CALIFORNIA
Volume/pages
12(1999) :11 , p. 1007-1009
ISSN
0953-2048
ISI
000083948400093
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
Abstract
YBa2Cu3O7-x artificial grain boundary Josephson junctions have been fabricated, employing a recently implemented biepitaxial technique. The grain boundaries can be obtained by controlling the orientation of the MgO seed layer and are characterized by a misalignment of the c-axes (45 degrees a-axis tilt or 45 degrees a-axis twist). These types of grain boundaries are still mostly unexplored. We carried out a complete characterization of their transport properties and microstructure. Junctions and de SQUIDs associated with these grain boundaries exhibit an excellent Josephson phenomenology and high values of the ICRN product and of the magnetic flux-to-voltage transfer parameter respectively. Remarkable differences in the transport parameters of tilt and twist junctions have been observed, which can be of interest for several applications. A maximum speed of Josephson vortices as calculated from the voltage step values of the order of 2 x 10(6) m s(-1) is obtained. These devices could also have some impact on experiments designed to study the symmetry of the order parameter, exploiting their microstructure and anisotropic properties. High-resolution electron microscopy showed the presence of perfect basal plane faced boundaries in the cross sections of tilt boundaries.
E-info
https://repository.uantwerpen.be/docman/iruaauth/2abd64/9914837.pdf
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