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Title
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A potential method to correlate electrical properties and microstructure of a unique high- superconducting Josephson junction
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Author
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Abstract
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| A method to correlate microstructure from cross-section transmission electron microscopy (TEM) investigations and transport properties of a single well characterized high-T-c artificial grain boundary junction is reported. A YBa2Cu3O7-delta 45 degrees twist junction exhibiting the typical phenomenology of high T-c Josephson weak links was employed. The TEM sample preparation is based on focused ion beam etching and allows to easily localize the electron transparent area on a microbridge. The reported technique opens clear perspectives in the determination of the microstructural origin of variations in Josephson junction properties, such as the spread in I-c and IcRN values and the presence of different transport regimes in nominally identical junctions. (C) 1999 American Institute of Physics. [S0003-6951(99)03404-X]. |
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Language
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English
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Source (journal)
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Applied physics letters / American Institute of Physics. - New York, N.Y., 1962, currens
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Publication
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New York, N.Y.
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American Institute of Physics
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1999
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ISSN
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0003-6951
[print]
1077-3118
[online]
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DOI
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10.1063/1.123443
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Volume/pages
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74
:7
(1999)
, p. 1024-1026
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ISI
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000078571400043
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Full text (Publisher's DOI)
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