Publication
Title
Study of ramp-type Josephson junctions by HREM
Author
Abstract
Structural aspects of ramp-type Josephson junctions based on REBa2Cu3O7-delta high-T-c superconductors, are investigated by cross-section transmission electron microscopy and results related to fabrication process or physical properties. The barrier layer material is PrBa2Cu3-xGaxO7-delta. The ramp-geometry depends on the etching conditions. High levels of Ga doping (x>0.7) influence the microstructure of the barrier layer thereby changing the junctions properties.
Language
English
Source (journal)
CONFERENCE SERIES- INSTITUTE OF PHYSICS
ELECTRONIC APPLICATIONS; VOL 2: LARGE SCALE AND POWER APPLICATIONS
Source (book)
3rd European Conference on Applied Superconductivity (EUCAS 1997), JUN 30-JUL 03, 1997, VELDHOVEN, NETHERLANDS
Publication
1997
ISBN
0-7503-0487-1
Volume/pages
158(1997), p. 49-52
ISI
000071955200012
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 03.01.2013
Last edited 11.08.2017
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