| Title |
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Study of ramp-type Josephson junctions by HREM
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| Author |
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| Abstract |
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| Structural aspects of ramp-type Josephson junctions based on REBa2Cu3O7-delta high-T-c superconductors, are investigated by cross-section transmission electron microscopy and results related to fabrication process or physical properties. The barrier layer material is PrBa2Cu3-xGaxO7-delta. The ramp-geometry depends on the etching conditions. High levels of Ga doping (x>0.7) influence the microstructure of the barrier layer thereby changing the junctions properties. | |
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| Language |
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English
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| Source (journal) |
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CONFERENCE SERIES- INSTITUTE OF PHYSICS |
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ELECTRONIC APPLICATIONS; VOL 2: LARGE SCALE AND POWER APPLICATIONS |
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| Source (book) |
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3rd European Conference on Applied Superconductivity (EUCAS 1997), JUN 30-JUL 03, 1997, VELDHOVEN, NETHERLANDS |
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| Publication |
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1997
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| ISBN |
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0-7503-0487-1
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| Volume/pages |
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158(1997), p. 49-52
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| ISI |
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000071955200012
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| Full text (publisher's version - intranet only) |
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