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Title
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Study of ramp-type Josephson junctions by HREM
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Author
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Abstract
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| Structural aspects of ramp-type Josephson junctions based on REBa2Cu3O7-delta high-T-c superconductors, are investigated by cross-section transmission electron microscopy and results related to fabrication process or physical properties. The barrier layer material is PrBa2Cu3-xGaxO7-delta. The ramp-geometry depends on the etching conditions. High levels of Ga doping (x>0.7) influence the microstructure of the barrier layer thereby changing the junctions properties. |
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Language
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English
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Source (journal)
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CONFERENCE SERIES- INSTITUTE OF PHYSICS
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ELECTRONIC APPLICATIONS; VOL 2: LARGE SCALE AND POWER APPLICATIONS
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Source (book)
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3rd European Conference on Applied Superconductivity (EUCAS 1997), JUN 30-JUL 03, 1997, VELDHOVEN, NETHERLANDS
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Publication
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1997
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ISBN
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0-7503-0487-1
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Volume/pages
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158
(1997)
, p. 49-52
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ISI
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000071955200012
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Full text (publisher's version - intranet only)
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