Publication
Title
High-accuracy assay of sub ppm traces of silicon by isotope-dilution mass-spectrometry
Author
Abstract
Thermal ionization mass spectrometry of silicon has been developed enabling high accuracy assay of Si by isotope dilution mass spectrometry (ID-MS). The method works with silicon in the form of sodium silicate and uses barium hydroxide to enhance ionization. In the process a Si-29 spike reference material was established. The new method was tested on water samples doped with 15 ppb of silicon and it was shown that ppb traces of silicon in water can be assayed to better than 10% accuracy (total uncertainty).
Language
English
Source (journal)
Analusis: chimie analytique, méthodes physiques d'analyse, composition de la matière. - Paris, 1972 - 2000
Publication
Paris : 1992
ISSN
0365-4877
Volume/pages
20:4(1992), p. 229-234
ISI
A1992HN28000018
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 03.01.2013
Last edited 24.04.2017
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