Title
High-accuracy assay of sub ppm traces of silicon by isotope-dilution mass-spectrometry High-accuracy assay of sub ppm traces of silicon by isotope-dilution mass-spectrometry
Author
Faculty/Department
Faculty of Sciences. Chemistry
Publication type
article
Publication
Paris ,
Subject
Chemistry
Source (journal)
Analusis: chimie analytique, méthodes physiques d'analyse, composition de la matière. - Paris, 1972 - 2000
Volume/pages
20(1992) :4 , p. 229-234
ISSN
0365-4877
ISI
A1992HN28000018
Carrier
E
Target language
English (eng)
Affiliation
University of Antwerp
Abstract
Thermal ionization mass spectrometry of silicon has been developed enabling high accuracy assay of Si by isotope dilution mass spectrometry (ID-MS). The method works with silicon in the form of sodium silicate and uses barium hydroxide to enhance ionization. In the process a Si-29 spike reference material was established. The new method was tested on water samples doped with 15 ppb of silicon and it was shown that ppb traces of silicon in water can be assayed to better than 10% accuracy (total uncertainty).
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