Title |
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Accuracy in single-crystal x-ray diffractometry : influence of atmospheric pressure, scan mode and crystal settlement on intensity profiles
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Author |
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Abstract |
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Language |
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English
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Source (journal) |
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Bulletin des sociétés chimiques belges. - Bruxelles | |
Publication |
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Bruxelles : 1992
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ISSN |
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0037-9646
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Volume/pages |
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101:1(1992), p. 5-13
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ISI |
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A1992HB16800002
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Full text (Publisher's DOI) |
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