| Title |
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Accuracy in single-crystal x-ray diffractometry : influence of atmospheric pressure, scan mode and crystal settlement on intensity profiles
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| Author |
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| Abstract |
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| Language |
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English
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| Source (journal) |
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Bulletin des sociétés chimiques belges. - Bruxelles | |
| Publication |
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Bruxelles : 1992
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| ISSN |
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0037-9646
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| Volume/pages |
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101:1(1992), p. 5-13
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| ISI |
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A1992HB16800002
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| Full text (Publisher's DOI) |
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