| Title |
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Characterization of complex silver halide photographic systems by means of analytical electron microscopy
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| Author |
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| Language |
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English
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| Source (journal) |
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Microbeam analysis. - Deerfield Beach, Fla | |
| Publication |
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Deerfield Beach, Fla : 1994
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| ISSN |
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1061-3420
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| Volume/pages |
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3(1994), p. 1-29
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