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Title
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Evidence of strain induced structural change in hetero-epitaxial thin films with metal-insulator transition
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Author
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Abstract
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| Neodymium nickelate thin films have been prepared on NdGaO3 substrates by RF magnetron sputtering and post-annealing treatment under oxygen pressure. Transport properties are found to depend strongly on film thickness. Thick films show transport properties close to bulk ceramics, while very thin films exhibit a large transition from metal to insulator which occurs over a wide temperature range with high resistivity. Structure and surface morphology of the films have been investigated by Transmission Electron Microscopy (TEM) and Atomic Force Microscopy (AFM). Thin films (approximate to17 nm) grow heteroepitaxially, while thicker films (approximate to73 nm) show a granular structure. The thinnest sample suggests a symmetry change induced by the epitaxial strain of the substrate. This paper discusses the relationship between microstructure and transport properties. |
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Language
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English
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Source (journal)
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European physical journal: applied physics. - Paris, 1998, currens
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Publication
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Paris
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2004
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ISSN
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1286-0042
[print]
1286-0050
[online]
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DOI
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10.1051/EPJAP:2003087
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Volume/pages
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25
:1
(2004)
, p. 25-31
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ISI
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000187286000003
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Full text (Publisher's DOI)
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