| Title |
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Transmission electron microscopy on interface engineered superconducting thin films
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| Author |
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| Abstract |
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| Language |
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English
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| Source (journal) |
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IEEE transactions on applied superconductivity / IEEE [New York, N.Y.] - New York, N.Y. | |
| Publication |
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New York, N.Y. : 2003
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| ISSN |
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1051-8223
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| Volume/pages |
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13:2:3(2003), p. 2834-2837
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| ISI |
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000184242400101
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| Full text (Publisher's DOI) |
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