Publication
Title
Transmission electron microscopy on interface engineered superconducting thin films
Author
Abstract
Language
English
Source (journal)
IEEE transactions on applied superconductivity / IEEE [New York, N.Y.] - New York, N.Y.
Publication
New York, N.Y. : 2003
ISSN
1051-8223
Volume/pages
13:2:3(2003), p. 2834-2837
ISI
000184242400101
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 03.01.2013
Last edited 06.10.2018
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