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Title
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Microstructural investigation of thin films deposited on (001) MgO
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Author
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Abstract
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| The microstructure of BaTiO3 thin films, epitaxially deposited on (001) MgO by pulsed laser ablation, has been investigated by transmission electron microscopy. The films are always c-axis-orientated, but dislocations, {111} stacking faults, and antiphase boundaries are frequently observed. Conventional TEM and high-resolution microscopy allow one to deduce the Burgers vectors of dislocations as b(1) = <100> or b(2) = <110>, both being perfect dislocations. Most extrinsic stacking faults are ending at 1/3<112> or 1/3<111> partial dislocations; the displacement vector of the antiphase boundaries is 1/2<101>. Studying the interfacial structure by means of zone images taken along [100] and [110] shows that the misfit is mainly released by dislocations with Burgers vectors of 1/2<110> and 1/2<101>. |
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Language
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English
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Source (journal)
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Journal of materials research. - New York, N.Y., 1986, currens
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Publication
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New York, N.Y.
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2002
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ISSN
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0884-2914
[print]
2044-5326
[online]
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DOI
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10.1557/JMR.2002.0285
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Volume/pages
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17
:8
(2002)
, p. 1923-1931
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ISI
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000177208800010
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Full text (Publisher's DOI)
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