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Publication
Title
Microstructural investigation of thin films deposited on (001) MgO
Author
Abstract
The microstructure of BaTiO3 thin films, epitaxially deposited on (001) MgO by pulsed laser ablation, has been investigated by transmission electron microscopy. The films are always c-axis-orientated, but dislocations, {111} stacking faults, and antiphase boundaries are frequently observed. Conventional TEM and high-resolution microscopy allow one to deduce the Burgers vectors of dislocations as b(1) = <100> or b(2) = <110>, both being perfect dislocations. Most extrinsic stacking faults are ending at 1/3<112> or 1/3<111> partial dislocations; the displacement vector of the antiphase boundaries is 1/2<101>. Studying the interfacial structure by means of zone images taken along [100] and [110] shows that the misfit is mainly released by dislocations with Burgers vectors of 1/2<110> and 1/2<101>.
Language
English
Source (journal)
Journal of materials research. - New York, N.Y., 1986, currens
Publication
New York, N.Y. : 2002
ISSN
0884-2914 [print]
2044-5326 [online]
DOI
10.1557/JMR.2002.0285
Volume/pages
17 :8 (2002) , p. 1923-1931
ISI
000177208800010
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identifier c:irua:103343
Creation 03.01.2013
Last edited 23.12.2024
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