Publication
Title
Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM
Author
Abstract
Language
English
Source (journal)
Physica: B: condensed matter. - Amsterdam
Source (book)
21st International Conference on Defects in Semiconductors, JUL 16-20, 2001, GIESSEN, GERMANY
Publication
Amsterdam : Elsevier science bv, 2001
ISSN
0921-4526
Volume/pages
308(2001), p. 294-297
ISI
000173660100073
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 03.01.2013
Last edited 06.09.2018
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