| Title |
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Compositional analysis based on electron holography and a chemically sensitive reflection
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| Author |
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| Abstract |
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| Language |
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English
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| Source (journal) |
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Ultramicroscopy. - Amsterdam |
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| Publication |
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Amsterdam : 2001
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| ISSN |
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0304-3991
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| Volume/pages |
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88:1(2001), p. 51-61
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| ISI |
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000168940900005
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| Full text (Publisher's DOI) |
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| Full text (publisher's version - intranet only) |
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