Publication
Title
On the combined impact of soft and medium gate oxide breakdown and process variability on the parametric figures of SRAM components
Author
Abstract
Language
English
Source (journal)
Records of the IEEE International Workshop on Memory Technology, Design, and Testing. - Los Alamitos, Calif, 1994, currens
and Testing, Proceedings
Source (book)
14th IEEE International Workshop on Memory Technology, Design and, Testing, AUG 02-04, 2006, Taipei, TAIWAN
Publication
Los alamitos : Ieee computer soc, 2006
ISBN
0-7695-2572-5
Volume/pages
(2006), p. 71-76
ISI
000240106100011
UAntwerpen
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 03.01.2013
Last edited 02.09.2018
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