Publication
Title
A new method to calculate leakage current and its applications for sub-45nm MOSFETs
Author
Abstract
Language
English
Source (book)
ESSDERC 2005 : proceedings of 35th European Solid-State Device Research Conference, September 12-16, 2005, Grenoble, France
Publication
S.l. : IEEE, 2005
ISBN
0-7803-9203-5
Volume/pages
p. 489-492
ISI
000236176200114
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 03.01.2013
Last edited 07.05.2018
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