Publication
Title
Accurate broadband parameter extraction methodology for S-parameter measurements
Author
Abstract
GHz range operating frequencies of today's semiconductor devices demand accurate interconnect models. Constructing accurate and scalable models require extraction of interconnect parameters namely resistance-R, inductance-L, capacitance-C and conductance-G from measured S-parameters. The parameter extraction is error prone influenced by half-wavelength resonance. In this paper, we present a new methodology for accurately extracting interconnect parameters from measured S-parameters. We first analyze the parameter extraction errors and show that it can be mainly attributed to non-perfect de-embedding. Based on the error analysis, we derive an extraction flow for accurate interconnect characterization. The proposed method is validated with fabricated transmission line test structures. Extracted line parameters agree with well-known theoretical models, establishing accuracy of the method.
Language
English
Source (journal)
Signal Propagation on Interconnects, Proceedings
Source (book)
9th IEEE Workshop on Signal Propagation on Interconnects, MAY 10-13, 2005, Garmisch Partenkirchen, GERMANY
Publication
2005
ISBN
0-7803-9054-7
Volume/pages
(2005), p. 57-60
ISI
000231086800010
Full text (Publisher's DOI)
UAntwerpen
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 03.01.2013
Last edited 06.11.2017
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