Publication
Title
PIXE and ToF-SIMS analysis of streaker samplers filters
Author
Abstract
Language
English
Source (journal)
Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms. - Amsterdam
INTERACTIONS WITH MATERIALS AND ATOMS
Publication
Amsterdam : 2004
ISSN
0168-583X
Volume/pages
222:1-2(2004), p. 261-269
ISI
000222062200030
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 03.01.2013
Last edited 29.06.2018
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