Publication
Title
PIXE and ToF-SIMS analysis of streaker samplers filters
Author
Abstract
The paper presents methodological innovations introduced in the characterisation of urban aerosol collected in Italy in a recent campaign. Two complementary ion beam analysis (IBA) techniques were used to analyse Nuclepore filters used in continuous streaker samplers to collect airborn particles in four Italian towns. Na to Pb elemental concentrations were obtained by particle induced X-ray emission (PIXE), while time of flight secondary ion mass spectrometry (ToF-SIMS) produced, on the same samples, time trends for several elements and molecular fragments. In addition, light attenuation measurements were used as a tracer for black carbon. The data produced by these three techniques was merged into a unique data set to address the characterisation of particulate matter sources. Correlations between elemental concentration trends (PIXE) and relative trends for molecular fragments (ToF-SIMS) and black carbon (light attenuation) have been studied by cluster and principal component analysis. (C) 2004 Elsevier B.V. All rights reserved.
Language
English
Source (journal)
Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms. - Amsterdam
INTERACTIONS WITH MATERIALS AND ATOMS
Publication
Amsterdam : 2004
ISSN
0168-583X
Volume/pages
222:1-2(2004), p. 261-269
ISI
000222062200030
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 03.01.2013
Last edited 07.12.2017
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