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Title
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PIXE and ToF-SIMS analysis of streaker samplers filters
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Author
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Abstract
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| The paper presents methodological innovations introduced in the characterisation of urban aerosol collected in Italy in a recent campaign. Two complementary ion beam analysis (IBA) techniques were used to analyse Nuclepore filters used in continuous streaker samplers to collect airborn particles in four Italian towns. Na to Pb elemental concentrations were obtained by particle induced X-ray emission (PIXE), while time of flight secondary ion mass spectrometry (ToF-SIMS) produced, on the same samples, time trends for several elements and molecular fragments. In addition, light attenuation measurements were used as a tracer for black carbon. The data produced by these three techniques was merged into a unique data set to address the characterisation of particulate matter sources. Correlations between elemental concentration trends (PIXE) and relative trends for molecular fragments (ToF-SIMS) and black carbon (light attenuation) have been studied by cluster and principal component analysis. (C) 2004 Elsevier B.V. All rights reserved. |
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Language
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English
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Source (journal)
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Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms. - Amsterdam
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INTERACTIONS WITH MATERIALS AND ATOMS
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Publication
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Amsterdam
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2004
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ISSN
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0168-583X
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DOI
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10.1016/J.NIMB.2004.02.014
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Volume/pages
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222
:1-2
(2004)
, p. 261-269
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ISI
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000222062200030
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Full text (Publisher's DOI)
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Full text (publisher's version - intranet only)
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