Publication
Title
The influence of surface fluctuations on early failures in single-damascene Cu wires : a weakest link approximation analysis
Author
Abstract
Language
English
Source (journal)
2004 IEEE International reliability symposium proceedings
Source (book)
42nd Annual IEEE International Reliability Physics Symposium, APR 25-29, 2004, Phoenix, AZ
Publication
New york : Ieee, 2004
ISBN
0-7803-8315-X
Volume/pages
(2004), p. 625-626
ISI
000222139900130
Full text (Publisher's DOI)
UAntwerpen
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 03.01.2013
Last edited 02.08.2018
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