Publication
Title
Distributed dielectric charging and its impact on RF MEMS devices
Author
Abstract
This paper gives a new insight into the problem of RF MEMS irreversible stiction due to dielectric charging. Previous reported works describing the phenomenon only account for a drift of the actuation characteristics as a whole as they consider uniform charge densities. We demonstrate how the spatial charge distribution in the dielectric layer can result in the failure of the devices. We emphasize the role of the variance of the distribution, a parameter neglected in the literature. Our model can account for a shift of the C-V actuation characteristics but also for a change in its profile. In particular, the pull-out window can be narrowed and even made to disappear as a result of the non-zero variance of the charge distribution. We identify the processing, the contact conditions and the distributed charge depths as variance- and thus failure-enhancer parameters.
Language
English
Source (journal)
34TH European microwave conference, vols 1-3, conference proceedings
Source (book)
34th European Microwave Conference (EuMC), OCT 12-14, 2004, Amsterdam, NETHERLANDS
Publication
2004
ISBN
1-58053-992-0
Volume/pages
(2004), p. 77-80
ISI
000226599600020
UAntwerpen
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 03.01.2013
Last edited 31.08.2017
To cite this reference