Publication
Title
A novel approach to analyse FTIR spectra of precipitates in boron-doped silicon
Author
Abstract
Language
English
Source (journal)
Physica: B: condensed matter. - Amsterdam
Source (book)
22nd International Conference on Defects in Semiconductors (ICDS-22), JUL 28-AUG 01, 2003, UNIV AARHUS, AARHUS, DENMARK
Publication
Amsterdam : 2003
ISSN
0921-4526
Volume/pages
340(2003), p. 1013-1017
ISI
000188300200213
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 03.01.2013
Last edited 09.07.2018
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