Publication
Title
EM-induced mass transport at the Cu/barrier interface : a new test structure for rapid assessment at user conditions
Author
Abstract
Language
English
Source (journal)
Proceedings of the Ieee 2003 international interconnect technology conference
Source (book)
6th Annual International Interconnect Technology Conference, JUN 02-04, 2003, BURLINGAME, CA
Publication
2003
ISBN
0-7803-7797-4
Volume/pages
(2003), p. 21-23
ISI
000184465800006
Full text (Publisher's DOI)
UAntwerpen
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 03.01.2013
Last edited 02.09.2018
To cite this reference