| Title |
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EM-induced mass transport at the Cu/barrier interface : a new test structure for rapid assessment at user conditions
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| Author |
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| Abstract |
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| Language |
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English
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| Source (journal) |
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Proceedings of the Ieee 2003 international interconnect technology conference | |
| Source (book) |
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6th Annual International Interconnect Technology Conference, JUN 02-04, 2003, BURLINGAME, CA | |
| Publication |
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2003
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| ISBN |
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0-7803-7797-4
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| Volume/pages |
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(2003), p. 21-23
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| ISI |
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000184465800006
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| Full text (Publisher's DOI) |
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