Publication
Title
Small sample corrections for LTS and MCD
Author
Abstract
Language
English
Source (journal)
Metrika. - Wien
Source (book)
International Conference on Robust Statistics, JUL 23-27, 2001, VORAU, AUSTRIA
Publication
Wien : 2002
ISSN
0026-1335
Volume/pages
55:1-2(2002), p. 111-123
ISI
000175702200011
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 03.01.2013
Last edited 17.05.2018
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