Publication
Title
In situ transmission electron microscopy study of the silicidation process in Co thin films on patterned (001) Si substrates
Author
Abstract
Language
English
Source (journal)
Journal of materials research. - New York, N.Y.
Publication
New York, N.Y. : 2001
ISSN
0884-2914
Volume/pages
16:3(2001), p. 701-708
ISI
000167407200011
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 03.01.2013
Last edited 24.09.2018
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