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Title
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Thin film analysis of chromium-phosphate conversion coatings on aluminium probed by ToF-SIMS and electron probe x-ray analysis
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Author
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Abstract
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| Time-of-flight SIMS was used to study chromium phosphate conversion layers on Al. During coating formation, fluorine is buried under a layer of CrPxOy as the layer thickens, yielding a duplex layer structure. Electron probe x-ray microanalysis was used to assess the variation in elemental composition of the coating, Preliminary results demonstrate a number of problems related to quantitative analysis of the coatings studied. Copyright (C) 2000 John Wiley & Sons, Ltd. |
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Language
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English
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Source (journal)
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Surface and interface analysis. - London
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Source (book)
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8th European Conference on Applications of Surface and Interface, Analysis, OCT 04-08, 1999, SEVILLE, SPAIN
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Publication
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London
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2000
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ISSN
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0142-2421
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DOI
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10.1002/1096-9918(200008)30:1<589::AID-SIA706>3.0.CO;2-N
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Volume/pages
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30
:1
(2000)
, p. 589-591
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ISI
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000089238400127
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Full text (Publisher's DOI)
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Full text (publisher's version - intranet only)
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