Publication
Title
Thin film analysis of chromium-phosphate conversion coatings on aluminium probed by ToF-SIMS and electron probe x-ray analysis
Author
Cuynen, Erik
Goeminne, Gudrun
van Espen, Pierre
Terryn, Herman
Abstract
Language
English
Source (journal)
Surface and interface analysis. - London
Source (book)
8th European Conference on Applications of Surface and Interface, Analysis, OCT 04-08, 1999, SEVILLE, SPAIN
Publication
London
:
2000
ISSN
0142-2421
Volume/pages
30:1(2000), p. 589-591
ISI
000089238400127
Full text (Publisher's DOI)
https://doi.org/10.1002/1096-9918(200008)30:1<589::AID-SIA706>3.0.CO;2-N
Full text (publisher's version - intranet only)
https://repository.uantwerpen.be/docman/iruaauth/cd9f46/9cf6794.pdf
UAntwerpen
Faculty/Department
Faculty of Sciences. Chemistry
Research group
Chemometrics (Mitac 3)
Publication type
A1 Journal article
Subject
Chemistry
Affiliation
Publications with a UAntwerp address
External links
Web of Science
View record in Web of Science®
View citing articles in Web of Science®
View Related Records® in Web of Science®
Record
Identification
Creation
03.01.2013
Last edited
23.03.2020
To cite this reference
https://hdl.handle.net/10067/1039430151162165141