Publication
Title
Thin film analysis of chromium-phosphate conversion coatings on aluminium probed by ToF-SIMS and electron probe x-ray analysis
Author
Abstract
Language
English
Source (journal)
Surface and interface analysis. - London
Source (book)
8th European Conference on Applications of Surface and Interface, Analysis, OCT 04-08, 1999, SEVILLE, SPAIN
Publication
London : 2000
ISSN
0142-2421
Volume/pages
30:1(2000), p. 589-591
ISI
000089238400127
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 03.01.2013
Last edited 04.05.2018
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