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Thin film analysis of chromium-phosphate conversion coatings on aluminium probed by ToF-SIMS and electron probe x-ray analysis
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| Abstract |
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| Time-of-flight SIMS was used to study chromium phosphate conversion layers on Al. During coating formation, fluorine is buried under a layer of CrPxOy as the layer thickens, yielding a duplex layer structure. Electron probe x-ray microanalysis was used to assess the variation in elemental composition of the coating, Preliminary results demonstrate a number of problems related to quantitative analysis of the coatings studied. Copyright (C) 2000 John Wiley & Sons, Ltd. | |
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English
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Surface and interface analysis. - London |
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8th European Conference on Applications of Surface and Interface, Analysis, OCT 04-08, 1999, SEVILLE, SPAIN |
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London : 2000
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0142-2421
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| Volume/pages |
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30:1(2000), p. 589-591
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| ISI |
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000089238400127
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| Full text (Publisher's DOI) |
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