Publication
Title
Thin film analysis of chromium-phosphate conversion coatings on aluminium probed by ToF-SIMS and electron probe x-ray analysis
Author
Abstract
Time-of-flight SIMS was used to study chromium phosphate conversion layers on Al. During coating formation, fluorine is buried under a layer of CrPxOy as the layer thickens, yielding a duplex layer structure. Electron probe x-ray microanalysis was used to assess the variation in elemental composition of the coating, Preliminary results demonstrate a number of problems related to quantitative analysis of the coatings studied. Copyright (C) 2000 John Wiley & Sons, Ltd.
Language
English
Source (journal)
Surface and interface analysis. - London
Source (book)
8th European Conference on Applications of Surface and Interface, Analysis, OCT 04-08, 1999, SEVILLE, SPAIN
Publication
London : 2000
ISSN
0142-2421
Volume/pages
30:1(2000), p. 589-591
ISI
000089238400127
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 03.01.2013
Last edited 13.07.2017
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