Publication
Title
Reduced dimensionality in different forms of carbon
Author
Abstract
Several TEM techniques are used to characterise the local structure of low dimensional forms of carbon. HREM is particularly useful to describe the defect structure of thin films of diamond or fullerenes and C-60-C-70 nanoclusters. A columnar form of graphite is analysed, mainly by electron diffraction which allowed us to propose a growth mechanism. Diffraction contrast dark field microscopy, in combination with electron diffraction, allows a detailed characterisation of carbon nanotubes; e.g. the chirality distribution of tubes in ropes of single wall tubes is studied by selected area electron diffraction. (C) 1998 Elsevier Science Ltd. All rights reserved.
Language
English
Source (journal)
Fullerenes and carbon based materials
Source (book)
Symposium A on Fullerenes and Carbon Based Materials, at the, European-Materials-Research-Society 1997 Meeting, JUN 16-20, 1997, STRASBOURG, FRANCE
Publication
1998
ISBN
0-444-20512-8
Volume/pages
68(1998), p. 487-493
ISI
000079731900002
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 03.01.2013
Last edited 03.05.2017
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