Reduced dimensionality in different forms of carbon
Faculty of Sciences. Physics
Fullerenes and carbon based materials
Symposium A on Fullerenes and Carbon Based Materials, at the, European-Materials-Research-Society 1997 Meeting, JUN 16-20, 1997, STRASBOURG, FRANCE
, p. 487-493
University of Antwerp
Several TEM techniques are used to characterise the local structure of low dimensional forms of carbon. HREM is particularly useful to describe the defect structure of thin films of diamond or fullerenes and C-60-C-70 nanoclusters. A columnar form of graphite is analysed, mainly by electron diffraction which allowed us to propose a growth mechanism. Diffraction contrast dark field microscopy, in combination with electron diffraction, allows a detailed characterisation of carbon nanotubes; e.g. the chirality distribution of tubes in ropes of single wall tubes is studied by selected area electron diffraction. (C) 1998 Elsevier Science Ltd. All rights reserved.