| Title |
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SIMS depth profiling of Cr-conversion layers on aluminium
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| Author |
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| Language |
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English
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| Source (journal) |
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ELECTRON MICROSCOPY 1998, VOL 1: GENERAL INTEREST AND INSTRUMENTATION | |
| Source (book) |
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14th International Congress on Electron Microscopy, AUG 31-SEP 04, 1998, CANCUN, MEXICO | |
| Publication |
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1998
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| ISBN |
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0-7503-0564-9
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| Volume/pages |
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(1998), p. 369-370
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| ISI |
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000077017600172
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