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Title
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A global entropy criterion for focus tuning in exit wavefunction reconstruction in high resolution electron microscopy
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Author
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Language
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English
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Source (journal)
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INTERNATIONAL CONFERENCE ON IMAGE PROCESSING, PROCEEDINGS - VOL I
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Source (book)
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International Conference on Image Processing (ICIP-96), SEP 16-19, 1996, LAUSANNE, SWITZERLAND
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Publication
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New york
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I e e e
,
1996
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ISBN
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0-7803-3259-8
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Volume/pages
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(1996)
, p. 737-740
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ISI
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A1996BG63E00185
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