Direct atomic structure determination of materials through computerised electron microscopy

Title				Direct atomic structure determination of materials through computerised electron microscopy

Author				Van Dyck, D. Op de Beeck, M.

Language				English

Source (journal)				JOINT CONFERENCE - 1996: IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE & IMEKO TECHNICAL COMMITTEE 7, CONFERENCE PROCEEDINGS, VOLS I AND II: QUALITY MEASUREMENTS: THE INDISPENSABLE BRIDGE BETWEEN THEORY AND REALITY (NO MEASUREMENTS? NO SCIENCE!)

Source (book)				Joint Conference 1996 - IEEE Instrumentation and Measurement Technology, Conference/IMEKO Technical Committee 7 (IMTC/96 - IMEKO TC-7), JUN 04-06, 1996, BRUSSELS, BELGIUM

Publication				New york : I e e e , 1996

ISBN				0-7803-3312-8

Volume/pages				(1996) , p. 901-903

ISI				A1996BF78W00174

Faculty/Department				Faculty of Sciences. Biology Faculty of Sciences. Physics

Project info
Publication type				P1 Proceeding

Subject				Physics Computer. Automation

Affiliation				Publications with a UAntwerp address

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03.01.2013

Last edited

04.03.2024

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