Publication
Title
Direct atomic structure determination of materials through computerised electron microscopy
Author
Language
English
Source (journal)
JOINT CONFERENCE - 1996: IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY
CONFERENCE & IMEKO TECHNICAL COMMITTEE 7, CONFERENCE PROCEEDINGS, VOLS I
AND II: QUALITY MEASUREMENTS: THE INDISPENSABLE BRIDGE BETWEEN THEORY
AND REALITY (NO MEASUREMENTS? NO SCIENCE!)
Source (book)
Joint Conference 1996 - IEEE Instrumentation and Measurement Technology, Conference/IMEKO Technical Committee 7 (IMTC/96 - IMEKO TC-7), JUN 04-06, 1996, BRUSSELS, BELGIUM
Publication
New york : I e e e, 1996
ISBN
0-7803-3312-8
Volume/pages
(1996), p. 901-903
ISI
A1996BF78W00174
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 03.01.2013
Last edited 20.07.2017
To cite this reference