Title
Quantification of impurities in brass using secondary-ion mass-spectrometry : a comparison of matrix effects for <tex>$CsM^{+}$</tex> clusters and <tex>$M^{+}$</tex> ions
Author
Faculty/Department
Faculty of Sciences. Chemistry
Publication type
article
Publication
Amsterdam ,
Subject
Physics
Chemistry
Source (journal)
International journal of mass spectrometry and ion processes. - Amsterdam
Volume/pages
151(1995) :1 , p. 63-68
ISSN
0168-1176
ISI
A1995TK35300007
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
Abstract
This study discusses the influence of matrix effects on relative sensitivity factors in secondary ion mass spectrometry for a quantification study of major and impurity elements in standard brass reference materials. A comparison has been made between relative sensitivity factors, which are obtained through acquisition of CsM(+) clusters under cesium bombardment and of M(+) ions under oxygen bombardment. The data of the present study suggest that the matrix effects have been reduced in the case of cesium clusters, but nevertheless remain significant. In addition, the reproducibility for determining relative sensitivity factors improves significantly for cesium clusters.
E-info
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