Publication
Title
Quantification of impurities in brass using secondary-ion mass-spectrometry : a comparison of matrix effects for $CsM^{+}$ clusters and $M^{+}$ ions
Author
Abstract
 This study discusses the influence of matrix effects on relative sensitivity factors in secondary ion mass spectrometry for a quantification study of major and impurity elements in standard brass reference materials. A comparison has been made between relative sensitivity factors, which are obtained through acquisition of CsM(+) clusters under cesium bombardment and of M(+) ions under oxygen bombardment. The data of the present study suggest that the matrix effects have been reduced in the case of cesium clusters, but nevertheless remain significant. In addition, the reproducibility for determining relative sensitivity factors improves significantly for cesium clusters.
Language
English
Source (journal)
International journal of mass spectrometry and ion processes. - Amsterdam
Publication
Amsterdam : 1995
ISSN
0168-1176
Volume/pages
151:1(1995), p. 63-68
ISI
A1995TK35300007
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
 Faculty/Department Research group Publication type Subject Affiliation Publications with a UAntwerp address