Title Quantification of impurities in brass using secondary-ion mass-spectrometry : a comparison of matrix effects for $CsM^{+}$ clusters and $M^{+}$ ions Author Adriaens, A. Férauge, C. Adams, F. Faculty/Department Faculty of Sciences. Chemistry Publication type article Publication 1995 Amsterdam , 1995 Subject Physics Chemistry Source (journal) International journal of mass spectrometry and ion processes. - Amsterdam Volume/pages 151(1995) :1 , p. 63-68 ISSN 0168-1176 ISI A1995TK35300007 Carrier E Target language English (eng) Full text (Publishers DOI) Affiliation University of Antwerp Abstract This study discusses the influence of matrix effects on relative sensitivity factors in secondary ion mass spectrometry for a quantification study of major and impurity elements in standard brass reference materials. A comparison has been made between relative sensitivity factors, which are obtained through acquisition of CsM(+) clusters under cesium bombardment and of M(+) ions under oxygen bombardment. The data of the present study suggest that the matrix effects have been reduced in the case of cesium clusters, but nevertheless remain significant. In addition, the reproducibility for determining relative sensitivity factors improves significantly for cesium clusters. E-info https://repository.uantwerpen.be/docman/iruaauth/7e4fad/7604293.pdf http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:A1995TK35300007&DestLinkType=RelatedRecords&DestApp=ALL_WOS&UsrCustomerID=ef845e08c439e550330acc77c7d2d848 http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:A1995TK35300007&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=ef845e08c439e550330acc77c7d2d848 http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:A1995TK35300007&DestLinkType=CitingArticles&DestApp=ALL_WOS&UsrCustomerID=ef845e08c439e550330acc77c7d2d848 Handle