| Title |
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Internal calibration technique for HREM studies of nanoscale particles
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| Author |
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| Language |
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English
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| Source (journal) |
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Microscopy research and technique. - New York, N.Y. | |
| Source (book) |
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JOINT MEETING OF DUTCH SOC FOR ELECTRON MICROSCOPY / BELGIAN SOC FOR, ELECTRON MICROSCOPY / BELGIAN SOC FOR CELL BIOLOGY, DEC 10-11, 1992, ANTWERP, BELGIUM | |
| Publication |
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New York, N.Y. : 1993
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| ISSN |
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1059-910X
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| Volume/pages |
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25:2(1993), p. 185-186
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| ISI |
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A1993LB60700015
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| Full text (Publisher's DOI) |
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