Title |
|
|
|
Internal calibration technique for HREM studies of nanoscale particles
| |
Author |
|
|
|
| |
Language |
|
|
|
English
| |
Source (journal) |
|
|
|
Microscopy research and technique. - New York, N.Y. | |
Source (book) |
|
|
|
JOINT MEETING OF DUTCH SOC FOR ELECTRON MICROSCOPY / BELGIAN SOC FOR, ELECTRON MICROSCOPY / BELGIAN SOC FOR CELL BIOLOGY, DEC 10-11, 1992, ANTWERP, BELGIUM | |
Publication |
|
|
|
New York, N.Y. : 1993
| |
ISSN |
|
|
|
1059-910X
| |
Volume/pages |
|
|
|
25:2(1993), p. 185-186
| |
ISI |
|
|
|
A1993LB60700015
| |
Full text (Publisher's DOI) |
|
|
| | |
|