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Title
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Internal calibration technique for HREM studies of nanoscale particles
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Author
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Language
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English
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Source (journal)
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Microscopy research and technique. - New York, N.Y.
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Source (book)
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JOINT MEETING OF DUTCH SOC FOR ELECTRON MICROSCOPY / BELGIAN SOC FOR, ELECTRON MICROSCOPY / BELGIAN SOC FOR CELL BIOLOGY, DEC 10-11, 1992, ANTWERP, BELGIUM
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Publication
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New York, N.Y.
:
1993
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ISSN
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1059-910X
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DOI
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10.1002/JEMT.1070250216
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Volume/pages
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25
:2
(1993)
, p. 185-186
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ISI
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A1993LB60700015
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Full text (Publisher's DOI)
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