Publication
Title
Internal calibration technique for HREM studies of nanoscale particles
Author
Language
English
Source (journal)
Microscopy research and technique. - New York, N.Y.
Source (book)
JOINT MEETING OF DUTCH SOC FOR ELECTRON MICROSCOPY / BELGIAN SOC FOR, ELECTRON MICROSCOPY / BELGIAN SOC FOR CELL BIOLOGY, DEC 10-11, 1992, ANTWERP, BELGIUM
Publication
New York, N.Y. : 1993
ISSN
1059-910X
Volume/pages
25:2(1993), p. 185-186
ISI
A1993LB60700015
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 03.01.2013
Last edited 12.10.2017
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