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Title
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Ultra-resolution on a FEG-TEM by phase retrieval through focus variation
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Author
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Abstract
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| A field emission gun (FEG) in transmission electron microscopy (TEM) has a high potential in the run towards I Angstrom microscopy. Digital image reconstruction, applied on a focal image series, enables to retrieve faithfully the amplitude and phase at the specimen exit plane with a resolution much better than the point resolution. On a 300 kV FEG-TEM an information limit of 1.1 Angstrom has been obtained. The oxygen sublattice in a high-Tc superconductor and in a ferroelectric oxide has been revealed as well as the atomic stacking in Si <113>. |
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Language
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English
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Source (journal)
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Institute of physics conference series. - Bristol, 1985, currens
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Source (book)
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Conference of the Electron-Microscopy-and-Analysis-Group of the, Institute-of-Physics: Electron Microscopy and Analysis 1993 (EMAG93), SEP 14-17, 1993, UNIV LIVERPOOL, LIVERPOOL, ENGLAND
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Publication
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Bristol
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Adam Hilger
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1993
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ISBN
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0-7503-0321-2
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Volume/pages
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138
(1993)
, p. 225-230
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ISI
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A1993BA56Z00053
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