Publication
Title
Ultra-resolution on a FEG-TEM by phase retrieval through focus variation
Author
Abstract
A field emission gun (FEG) in transmission electron microscopy (TEM) has a high potential in the run towards I Angstrom microscopy. Digital image reconstruction, applied on a focal image series, enables to retrieve faithfully the amplitude and phase at the specimen exit plane with a resolution much better than the point resolution. On a 300 kV FEG-TEM an information limit of 1.1 Angstrom has been obtained. The oxygen sublattice in a high-Tc superconductor and in a ferroelectric oxide has been revealed as well as the atomic stacking in Si <113>.
Language
English
Source (journal)
CONFERENCE SERIES- INSTITUTE OF PHYSICS
Source (book)
Conference of the Electron-Microscopy-and-Analysis-Group of the, Institute-of-Physics: Electron Microscopy and Analysis 1993 (EMAG93), SEP 14-17, 1993, UNIV LIVERPOOL, LIVERPOOL, ENGLAND
Publication
1993
ISBN
0-7503-0321-2
Volume/pages
138(1993), p. 225-230
ISI
A1993BA56Z00053
UAntwerpen
Faculty/Department
Research group
[E?say:metaLocaldata.cgzprojectinf]
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 03.01.2013
Last edited 06.11.2017
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