Publication
Title
Polarized-beam high-energy EDXRF in geological samples
Author
Abstract
Certified reference materials (NIST 1645, BCR 143, IAEA 7, BCR 141, NIES_CRM_02, and IAEA 375) were used for determining the performance of a secondary target energy-dispersive X-ray fluorescence (EDXRF) spectrometer, Epsilon 5 (PANalytical, Almelo, the Netherlands). For the evaluation of the EDXRF spectra with polarized-beam high-energy excitation, the WinAxil software package has been applied. The results showed that Epsilon 5, EDXRF spectrometry is favorable for the determination of elemental concentrations in geological samples, but the sample preparation has the largest influence on the precision. However, they presented good agreement with certified values for most of the elements.
Language
English
Source (journal)
Spectroscopy letters. - New York
Publication
New York : 2013
ISSN
0038-7010
Volume/pages
46:1(2013), p. 36-46
ISI
000314018900005
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 28.03.2013
Last edited 21.10.2017
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