Title
Advanced three-dimensional electron microscopy techniques in the quest for better structural and functional materials Advanced three-dimensional electron microscopy techniques in the quest for better structural and functional materials
Author
Faculty/Department
Faculty of Sciences. Physics
Publication type
article
Publication
Sendai ,
Subject
Physics
Source (journal)
Science and technology of advanced materials. - Sendai
Volume/pages
14(2013) :1 , p. 1-13
ISSN
1468-6996
Article Reference
014206
Carrier
E-only publicatie
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
Abstract
After a short review of electron tomography techniques for materials science, this overview will cover some recent results on different shape memory and nanostructured metallic systems obtained by various three-dimensional (3D) electron imaging techniques. In binary NiTi, the 3D morphology and distribution of Ni4Ti3 precipitates are investigated by using FIB/SEM slice-and-view yielding 3D data stacks. Different quantification techniques will be presented including the principal ellipsoid for a given precipitate, shape classification following a Zingg scheme, particle distribution function, distance transform and water penetration. The latter is a novel approach to quantifying the expected matrix transformation in between the precipitates. The different samples investigated include a single crystal annealed with and without compression yielding layered and autocatalytic precipitation, respectively, and a polycrystal revealing different densities and sizes of the precipitates resulting in a multistage transformation process. Electron tomography was used to understand the interaction between focused ion beam-induced Frank loops and long dislocation structures in nanobeams of Al exhibiting special mechanical behaviour measured by on-chip deposition. Atomic resolution electron tomography is demonstrated on Ag nanoparticles in an Al matrix.
Full text (open access)
https://repository.uantwerpen.be/docman/irua/ef5135/bea0f5dd.pdf
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