Publication
Title
ToF-S-SIMS molecular 3D analysis of micro-objects as an alternative to ion beam erosion at large depth : application to single inkjet dots
Author
Abstract
Language
English
Source (journal)
Analytical and bioanalytical chemistry. - Berlin, 2002, currens
Publication
Berlin : 2013
ISSN
1618-2642
Volume/pages
405:6(2013), p. 2053-2064
ISI
000314681000027
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 22.04.2013
Last edited 17.07.2018
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