Title
High-resolution temporal profilometry using Fourier estimation High-resolution temporal profilometry using Fourier estimation
Author
Faculty/Department
Faculty of Sciences. Physics
Faculty of Applied Engineering Sciences
Publication type
bookPart
Publication
New York, N.Y. :Nova Science, [*]
Subject
Physics
Source (book)
Recent advances in topography research / Buytaert, Jan [edit.]
Source (series)
Engineering tools, techniques and tables
ISBN - Hoofdstuk
978-1-62618-840-2
Carrier
E
Target language
English (eng)
Affiliation
University of Antwerp
Handle