Publication
Title
Annular dark-field transmission electron microscopy for low contrast materials
Author
Abstract
Imaging soft matter by transmission electron microscopy (TEM) is anything but straightforward. Recently, interest has grown in developing alternative imaging modes that generate contrast without additional staining. Here, we present a dark-field TEM technique based on the use of an annular objective aperture. Our experiments demonstrate an increase in both contrast and signal-to-noise ratio in comparison to conventional bright-field TEM. The proposed technique is easy to implement and offers an alternative imaging mode to investigate soft matter.
Language
English
Source (journal)
Microscopy and microanalysis. - Cambridge, Mass.
Publication
Cambridge, Mass. : 2013
ISSN
1431-9276
Volume/pages
19:3(2013), p. 629-634
ISI
000319126300014
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 18.06.2013
Last edited 18.06.2017
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