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Title
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Electron diffraction measurement of the binding rigidity of free-standing graphene
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Author
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Abstract
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| A method for measuring the binding rigidity of free-standing graphene from the dependence of the short-wavelength spectral range of transverse structural fluctuations of a crystal is proposed. The fluctuation spectrum is measured according to the variation in electron-diffraction patterns derived in a transmission electron microscope while tilting the sample. |
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Language
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English
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Source (journal)
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Technical physics letters / American Institute of Physics. - New York, N.Y., 1993, currens
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Publication
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New York, N.Y.
:
American Institute of Physics
,
2013
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ISSN
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1063-7850
[print]
1090-6533
[online]
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DOI
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10.1134/S1063785013040081
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Volume/pages
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39
:4
(2013)
, p. 325-328
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ISI
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000319162600003
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Full text (Publisher's DOI)
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Full text (publisher's version - intranet only)
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