Publication
Title
Electron diffraction measurement of the binding rigidity of free-standing graphene
Author
Abstract
A method for measuring the binding rigidity of free-standing graphene from the dependence of the short-wavelength spectral range of transverse structural fluctuations of a crystal is proposed. The fluctuation spectrum is measured according to the variation in electron-diffraction patterns derived in a transmission electron microscope while tilting the sample.
Language
English
Source (journal)
Technical physics letters
Publication
2013
ISSN
1063-7850
Volume/pages
39:4(2013), p. 325-328
ISI
000319162600003
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 19.07.2013
Last edited 16.08.2017
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