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Strain measurement at the nanoscale : comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography
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| Author |
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| Abstract |
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| Language |
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English
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| Source (journal) |
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Ultramicroscopy. - Amsterdam |
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| Publication |
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Amsterdam : 2013
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| ISSN |
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0304-3991
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| Volume/pages |
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131(2013), p. 10-23
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| ISI |
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000322631200002
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| Full text (Publisher's DOI) |
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