Title |
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Strain measurement at the nanoscale : comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography
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Author |
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Abstract |
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Language |
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English
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Source (journal) |
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Ultramicroscopy. - Amsterdam |
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Publication |
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Amsterdam : 2013
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ISSN |
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0304-3991
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Volume/pages |
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131(2013), p. 10-23
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ISI |
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000322631200002
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Full text (Publisher's DOI) |
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Full text (publisher's version - intranet only) |
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