Publication
Title
Strain measurement at the nanoscale : comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography
Author
Abstract
Language
English
Source (journal)
Ultramicroscopy. - Amsterdam
Publication
Amsterdam : 2013
ISSN
0304-3991
Volume/pages
131(2013), p. 10-23
ISI
000322631200002
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 10.09.2013
Last edited 10.02.2018
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