Development and validation of an accurate one pixel resolution temporal profilometry technique
Faculty of Applied Engineering Sciences
Maastricht :Shaker, 2009
Engineering sciences. Technology
Proceedings of the 4th International Conference on Optical Measurement Techniques for Structures & Systems OPTIMESS 2009, Antwerp, Belgium, 25-26 May 2009. - Maastricht, 2009
Profilometry is widely used as a control method in automation systems or for scanning and converting real objects into 3 dimensional models. Different techniques using grids and lasers can be found in literature. The available techniques can be divided into two main categories: temporal and spatial profilometry [1,2,3]. Most setups are based on the spatial phase unwrapping method in which there is only need for one or a few images. The problem when using this class of unwrapping algorithms is that discontinuities in the model are difficult to measure. In this paper a temporal method is proposed in which a LCD projector is used in combination with an industrial camera. The proposed technique has a high accuracy, can handle discontinuities and is insensitive to variable light conditions.