Publication
Title
The use of synchrotron radiation for the characterization of artists' pigments and paintings
Author
Abstract
We review methods and recent studies in which macroscopic to (sub)microscopic X-ray beams were used for nondestructive analysis and characterization of pigments, paint microsamples, and/or entire paintings. We discuss the use of portable laboratory- and synchrotron-based instrumentation and describe several variants of X-ray fluorescence (XRF) analysis used for elemental analysis and imaging and combined with X-ray diffraction (XRD) and X-ray absorption spectroscopy (XAS). Macroscopic and microscopic (μ-)XRF variants of this method are suitable for visualizing the elemental distribution of key elements in paint multilayers. Technical innovations such as multielement, large-area XRF detectors have enabled such developments. The use of methods limited to elemental analysis or imaging usually is not sufficient to elucidate the chemical transformations that take place during natural pigment alteration processes. However, synchrotron-based combinations of μ-XRF, μ-XAS, and μ-XRD are suitable for such studies.
Language
English
Source (journal)
Annual review of analytical chemistry / Annual Reviews, Inc. - Palo Alto, Calif, 2008, currens
Publication
Palo Alto, Calif : Annual Reviews, 2013
ISSN
1936-1327
Volume/pages
6(2013), p. 399-425
ISI
000323887500019
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 14.11.2013
Last edited 03.07.2017
To cite this reference