Publication
Title
Characterizing the parallax error in multi-pinhole micro-SPECT reconstruction
Author
Language
English
Source (book)
Proceedings of the 2011 IEEE Nuclear Science Symposium and Medical Imaging Conference, 23-29 October 2011, Valencia, Spain
Publication
S.l. : Institute of Electrical and Electronics Engineers, 2011
ISSN
1082-3654
ISBN
978-1-4673-0120-6
Volume/pages
p. 2738-2741
ISI
000304755602201
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 19.11.2013
Last edited 10.06.2017
To cite this reference