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Title
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Characterizing the parallax error in multi-pinhole micro-SPECT reconstruction
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Author
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Language
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English
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Source (journal)
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IEEE conference record. - [New York, N.Y.], 1994, currens
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Source (book)
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Proceedings of the 2011 IEEE Nuclear Science Symposium and Medical Imaging Conference, 23-29 October 2011, Valencia, Spain
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Publication
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S.l.
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Institute of Electrical and Electronics Engineers
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2011
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ISSN
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1082-3654
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ISBN
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978-1-4673-0120-6
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Volume/pages
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p. 2738-2741
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ISI
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000304755602201
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