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Title
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Soil analysis by thin-film energy-dispersive X-ray fluorescence
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Author
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Abstract
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| Energy-dispersive x-ray fluorescence is advantageous for trace analysis of soils present as thin films. A target thickness of about 2 mg cm-2 provides a compromise between optimal sensitivity and minimal absorption effect or optimal accuracy. Sample preparation involves only suspending the finely ground soil in water and drying this suspension on a thin mylar foil glued on a ring that fits into the x.r.f. spectrometer. The effective sample weight present in the exciting beam area is computed from the scatter peaks, a method that cancels out target heterogeneity problems. High accuracy is demonstrated for many elements in reference soil and rock materials; a precision around 5% and a detection limit around 10 ppm can be achieved. As an illustration, results for 16 trace elements and preliminary interpretation are given for a series of pedologically important soil samples from Brasil. |
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Language
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English
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Source (journal)
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Analytica chimica acta. - Amsterdam, 1947, currens
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Publication
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Amsterdam
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1979
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ISSN
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0003-2670
[print]
1873-4324
[online]
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DOI
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10.1016/S0003-2670(01)93044-2
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Volume/pages
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108
(1979)
, p. 93-101
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ISI
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A1979HL44100012
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Full text (Publisher's DOI)
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Full text (publisher's version - intranet only)
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