Publication
Title
Radiation damage evaluation on LYSO and LuYAP materials through Dpa calculation assisted by Monte Carlo method
Author
Abstract
The aim of the present work is to study the radiation damage induced in LYSO and LuYAP crystals by the gamma radiation and the secondary electrons/positrons generated. The displacements per atom (dpa) distributions inside each material were calculated following the Monte Carlo assisted Classical Method (MCCM) introduced by the authors. As gamma sources were used Sc-44, Na-22 and V-48. Also the energy of gammas from the annihilation processes (511 keV) was included in the study. This procedure allowed studying the in-depth dpa distributions inside each crystal for all four sources. It was also possible to obtain the separate contribution from each atom to the total dpa. The LYSO crystals were found to receive more damage, mainly provoked by the displacements of silicon and oxygen atoms.
Language
English
Source (journal)
IEEE conference record. - [New York, N.Y.], 1994, currens
Source (book)
IEEE Nuclear Science Symposium/Medical Imaging Conference (NSS/MIC)/18th, International Workshop on Room-Temperature Semiconductor X-Ray and, Gamma-Ray Detectors, OCT 23-29, 2011, Valencia, SPAIN
Publication
[New York, N.Y.] : Institute of Electrical and Electronics Engineers , 2011
ISBN
978-1-4673-0120-6
Volume/pages
(2011) , p. 1609-1611
ISI
000304755601169
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identifier
Creation 22.01.2014
Last edited 09.10.2023
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