Publication
Title
Multiscale modeling of radiation damage and annealing in Si samples implanted with 57-Mn radioactive ions
Author
Abstract
Language
English
Source (journal)
IEEE conference record. - [New York, N.Y.], 1994, currens
Source (book)
IEEE Nuclear Science Symposium/Medical Imaging Conference (NSS/MIC)/18th, International Workshop on Room-Temperature Semiconductor X-Ray and, Gamma-Ray Detectors, OCT 23-29, 2011, Valencia, SPAIN
Publication
[New York, N.Y.] : Institute of Electrical and Electronics Engineers, 2011
ISBN
978-1-4673-0120-6
Volume/pages
(2011), p. 1754-1756
ISI
000304755601202
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 22.01.2014
Last edited 01.07.2018
To cite this reference